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A high-precision conductive component that connects testing equipment to chip lead (or pads) through physical contact, transmitting electrical signals between the tester (e.g., probe stations, test machines) and the chip to ensure accurate functional testing.

Test socket is a key interface component connecting the chip under test (DUT) and the testing system. It enables precise testing of the chip's functions and performance by providing stable mechanical contact and electrical connection. Its core role is to complete signal transmission, power supply, and data exchange without damaging the chip.

Burn-in socket is a specialized device used for aging tests, which can effectively simulate complex environmental conditions to replicate the aging effects that chips would experience during actual use.

Probe cards are used for wafer electrical parameter testing, and their selection and maintenance directly affect testing efficiency and reliability.

Semiconductor connector is a key component applied in semiconductor devices and related electronic systems, mainly used to achieve electrical connections between circuits, signal transmission, and mechanical fixation between devices. It has a wide range of applications and plays an important role in different scenarios.

1. Mainly used in the CP testing process, connecting the motherboard of the Tester and the Probe Card; 2. Contains precisely arranged spring probes with excellent mechanical and electronic characteristics;

It is a product made from metal raw materials through micro-stamping technology or other composite technologies. It is an important electronic component, mainly serving to protect and fix the internal electronic parts.

It is to make a product by injection molding one or several metal or other material parts of different materials. It reduces the original assembly process, improves efficiency and enhances the precision of the product. It mainly serves the purpose of electrical connection and fixation.

It involves molding plastic pellets into a product through injection molding. The product features high precision and efficiency, with extensive applications spanning the medical, robotics, automotive, military-industrial, and other sectors.

Stiffener is an essential component of the probe card, mainly used to enhance the mechanical stability of the probe card. By increasing the rigidity of the probe card, it prevents the probe card from bending during use, which could cause the probe to fail to precisely contact the solder pads or bumps on the chip, thereby affecting the accuracy of the test.

The Change Kit is a component of exchange fixtures used in the semiconductor packaging and testing field to adapt to different chips. It is mainly applied in automated testing equipment (ATE) and test sorting machines (Handler) to enhance testing efficiency and quality.

The test jig is a special tool designed for conducting tests and experiments on the functions, power calibration, lifespan, and performance of products.