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2D MEMS Probe Card

MEMS probe cards are mainly used for testing advanced process wafers, with significant advantages such as small Pad/Bump pitch, multi-sites, and high pin count.
Features
• OD: 50um-150um • Pitch: ≥ 45um • High pin count: 40k+ • Kelvin test available • Over rejection: ≤1% • Tri-temp. test: -55°C~175°C
Purchase Consultation
Contact number
+86 0512-8717 6308
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