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High-speed Coaxial Test Socket

High-speed coaxial test socket is a specialized testing interface designed specifically for semiconductor chips requiring high-frequency signal testing. It forms a coaxial structure in conjunction with coaxial probes to ensure impedance matching with the chip, thereby achieving optimal signal transmission integrity.
Features
• Special insulating material • Coaxial structure pitch: ≥0.35mm • Insert loss S21: 45-80GHz@-1dB • Return loss S11: 45-80GHz@-10dB
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+86 0512-8717 6308
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